MF7202 MANUFACTURING METROLOGY AND QUALITY ENGINEERING
UNIT I LASER METROLOGY AND PRECISION INSTRUMENTS
Introduction – types of lasers – laser in engineering metrology – metrological laser methods for applications in machine systems – Interferometry applications – speckle interferometry – laser interferometers in manufacturing and machine tool alignment testing – laser Doppler technique – laser Doppler anemometry - Laser telemetric systems – detection of microscopic imperfections on high quality surface Pitter NPL gauge interferometer – classification of optical scanning systems – high inertia laser scan technique – rotating mirror technique vibrational deflectors – magnetic vibrational deflector – iteration and scan enhancement 0 reflective, refractive and diffractive scanners. – laser gauging – bar coding – laser dimensional measurement system.
UNIT II CO-ORDINATE MEASURING SYSTEM
Co-ordinate metrology – CMM configurations – hardware components – software – Probe sensors – Displacement devices – performance evaluations – software – hardware – dynamic errors – thermal effects diagram – temperature variations environment control – applications – Roll of CMM in reverse engineering.
UNIT III QUALITY IN MANUFACTURING AND DESIGN ENGINEERING
Importance of manufacturing planning for quality – initial planning and concept of quality – self controls – defining quality responsibilities on the factory flow – automated manufacturing – overall view of manufacturing planning – process quality audits – Opportunities for improvement in product design – early warning concepts and design assurance – design for basic functional requirements – design for reliability – availability – designing for manufacturability and safety – cost of quality – design review concurrent engineering – improving the effectiveness of product development.
UNIT IV QUALITY MANAGEMENT SYSTEM AND CONTINUOUS IMPROVEMENT
Need for quality management system – design of quality management system – quality management system requirements – ISO 9001 and other management system and models – basic quality engineering tools statistical process control – techniques for process design and improvement – Taguchi methods for process improvement – six sigma.
REFERENCES:
1. Oakland J.S. Total Quality Management – Text with cases, Butter worth – Heinemann – An imprint of Elseiver, First Indian Print, New Delhi 2005.
2. Elanchezhian.C, Vijaya Ramnath.B and Sunder Selwyn, T., Engineering Metrology, Eswar Press, Chennai, 2004.
3. Zuech, Nello Understanding and Applying Machine Vision, Marcel Dekker, Inc, 2000
4. John A. Bosch, Giddings and Lewis Dayton, Co-ordinate Measuring Machines and Systems, Marcel Dekker, Inc, 1999.
Juran J.M. and Gyna F.M., Quality Planning and Analysis, Tata-McGraw Hill, New Delhi, 1995.
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